Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/55436
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dc.contributor.authorSan Miguel Montesdeoca, Marioen_US
dc.contributor.authorMateos Angulo, Sergioen_US
dc.contributor.authorKhemchandani, S. L.en_US
dc.contributor.authorDel Pino, J.en_US
dc.date.accessioned2019-05-20T09:13:26Z-
dc.date.available2019-05-20T09:13:26Z-
dc.date.issued2017en_US
dc.identifier.urihttp://hdl.handle.net/10553/55436-
dc.languageengen_US
dc.sourceBiannual European - Latin American Summer School on Design, Test and Reliability (Internacional). Rotterdam, The Netherlandsen_US
dc.subject33 Ciencias tecnológicasen_US
dc.titleAnalysis of single event transients in conventional LNA topologies and radiation hardening approachesen_US
dc.typeinfo:eu-repo/semantics/conferenceobjecten_US
dc.typeConference posteren_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Póster de congresosen_US
dc.identifier.ulpgces
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Tecnología Microelectrónica-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Tecnología Microelectrónica-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0087-2370-
crisitem.author.orcid0000-0003-2610-883X-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameLalchand Khemchandani, Sunil-
crisitem.author.fullNameDel Pino Suárez, Francisco Javier-
Appears in Collections:Póster de congreso
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