Please use this identifier to cite or link to this item:
http://hdl.handle.net/10553/55436
DC Field | Value | Language |
---|---|---|
dc.contributor.author | San Miguel Montesdeoca, Mario | en_US |
dc.contributor.author | Mateos Angulo, Sergio | en_US |
dc.contributor.author | Khemchandani, S. L. | en_US |
dc.contributor.author | Del Pino, J. | en_US |
dc.date.accessioned | 2019-05-20T09:13:26Z | - |
dc.date.available | 2019-05-20T09:13:26Z | - |
dc.date.issued | 2017 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/55436 | - |
dc.language | eng | en_US |
dc.source | Biannual European - Latin American Summer School on Design, Test and Reliability (Internacional). Rotterdam, The Netherlands | en_US |
dc.subject | 33 Ciencias tecnológicas | en_US |
dc.title | Analysis of single event transients in conventional LNA topologies and radiation hardening approaches | en_US |
dc.type | info:eu-repo/semantics/conferenceobject | en_US |
dc.type | Conference poster | en_US |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Póster de congresos | en_US |
dc.identifier.ulpgc | Sí | es |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Tecnología Microelectrónica | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-0087-2370 | - |
crisitem.author.orcid | 0000-0003-2610-883X | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Khemchandani Lalchand, Sunil | - |
crisitem.author.fullName | Del Pino Suárez, Francisco Javier | - |
Appears in Collections: | Póster de congreso |
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