Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/54366
DC FieldValueLanguage
dc.contributor.authorPlaza, Angelen_US
dc.contributor.authorPadrón, Miguel A.en_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherPLAZA, ANGEL-
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2019-02-18T10:20:56Z-
dc.date.available2019-02-18T10:20:56Z-
dc.date.issued2005en_US
dc.identifier.issn0168-9274en_US
dc.identifier.urihttp://hdl.handle.net/10553/54366-
dc.description.abstractIn this paper we show empirical evidence on the non-degeneracy property of the tetrahedral meshes obtained by iterative application of the 8-tetrahedra longest-edge (8T-LE) partition. The 8T-LE partition of an initial tetrahedron t yields an infinite sequence of tetrahedral meshes τ1={t},τ2={ti2},τ3={ti3},… . We give numerical experiments showing that for a standard shape measure introduced by Liu and Joe (η), the non-degeneracy convergence to a fixed positive value is guaranteed, that is, for any tetrahedron tin in τn, n⩾1, η(tin)⩾cη(t) where c is a positive constant independent of i and n. Based on our experiments, estimates of c are provided.en_US
dc.languageengen_US
dc.relation.ispartofApplied Numerical Mathematicsen_US
dc.sourceApplied Numerical Mathematics [ISSN 0168-9274], v. 55, p. 458-472en_US
dc.subject120601 Construcción de algoritmosen_US
dc.subject.otherMesh qualityen_US
dc.subject.otherDegeneracyen_US
dc.subject.other8-tetrahedra longest-edge partitionen_US
dc.titleNon-degeneracy study of the 8-tetrahedra longest-edge partitionen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.identifier.doi10.1016/j.apnum.2004.12.003
dc.identifier.scopus26844436541-
dc.identifier.isi000232989700006-
dc.contributor.authorscopusid7006613647-
dc.contributor.authorscopusid6603825227-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage472-
dc.description.firstpage458-
dc.relation.volume55-
dc.investigacionCienciasen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000232989700006-
dc.contributor.daisngid259483-
dc.contributor.daisngid3168114-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDA-8210-2008-
dc.identifier.investigatorRIDC-1092-2012-
dc.identifier.externalWOS:000232989700006-
dc.contributor.wosstandardWOS:Plaza, A
dc.contributor.wosstandardWOS:Padron, MA
dc.contributor.wosstandardWOS:Suarez, JP
dc.date.coverdateDiciembre 2005
dc.identifier.ulpgces
dc.description.jcr0,589
dc.description.jcrqQ3
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNameSuárez Rivero, José Pablo-
Appears in Collections:Actas de congresos
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