Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49649
DC FieldValueLanguage
dc.contributor.authorSosa, Javieren_US
dc.contributor.authorMontiel-Nelson, Juan A.en_US
dc.contributor.authorNooshabadi, Saeiden_US
dc.contributor.otherMontiel-Nelson, Juan-
dc.date.accessioned2018-11-24T09:37:01Z-
dc.date.available2018-11-24T09:37:01Z-
dc.date.issued2010en_US
dc.identifier.issn0218-1266en_US
dc.identifier.urihttp://hdl.handle.net/10553/49649-
dc.description.abstractIn this paper, we present a genetic algorithm (GA) based methodology for vector generation that maximizes the metric of datapath coverage for a given combinational logic circuit, and compare it with a standard greedy algorithm. The search of maximum coverage vectors is a complex optimization of a satisfiability problem. The GA deals with the optimization problem, whilst an external satisfiability solver is invoked to deal with the coverage problem. Experimental results and performance comparisons based on the large set of MCNC'91 suite of benchmark circuits are presented. They show significant speedups of the GA methodology against a greedy algorithm for large circuits.en_US
dc.languageengen_US
dc.publisher0218-1266-
dc.relation.ispartofJournal of Circuits, Systems and Computersen_US
dc.sourceJournal of Circuits, Systems and Computers[ISSN 0218-1266],v. 19, p. 435-450en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherVector generationen_US
dc.subject.othergenetic algorithmsen_US
dc.subject.otherdatapath coverageen_US
dc.subject.otherVLSIen_US
dc.titleA genetic algorithm methodology to find the maximum datapath coverage for combinational logic circuitsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1142/S0218126610006165en_US
dc.identifier.scopus77951598650-
dc.identifier.isi000275469300009-
dcterms.isPartOfJournal Of Circuits Systems And Computers-
dcterms.sourceJournal Of Circuits Systems And Computers[ISSN 0218-1266],v. 19 (2), p. 435-450-
dc.contributor.authorscopusid7006310063-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid6602486254-
dc.description.lastpage450en_US
dc.description.firstpage435en_US
dc.relation.volume19en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000275469300009-
dc.contributor.daisngid1739656-
dc.contributor.daisngid480589-
dc.contributor.daisngid184255-
dc.identifier.investigatorRIDK-6805-2013-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Sosa, J-
dc.contributor.wosstandardWOS:Montiel-Nelson, JA-
dc.contributor.wosstandardWOS:Nooshabadi, S-
dc.date.coverdateAbril 2010en_US
dc.identifier.ulpgces
dc.description.jcr0,215
dc.description.jcrqQ4
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSosa González, Carlos Javier-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
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