Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/48830
Campo DC Valoridioma
dc.contributor.authorTobajas, Félixen_US
dc.contributor.authorDe Armas, Valentín D.en_US
dc.date.accessioned2018-11-24T01:19:37Z-
dc.date.available2018-11-24T01:19:37Z-
dc.date.issued2011en_US
dc.identifier.isbn9781612846439en_US
dc.identifier.urihttp://hdl.handle.net/10553/48830-
dc.description.abstractThough Peer Mentoring is often cited as among the most influential factors on retention rates and degree completion, that influence is difficult to assess. From the academic year 2007- 2008, the evaluation of the Mentoring Program of the Escuela Técnica Superior de Ingenieros de Telecomunicacin (PM-ETSIT) at the University of Las Palmas de Gran Canaria (ULPGC), which is currently in its seventh year of operation, involves as a differential factor a complementary evaluation based on specific satisfaction surveys completed by Mentees after staying three years at the University. In this paper, the results obtained from the appraisal of the influence of the PM-ETSIT in different aspects of the student's academic life, including their decision to remain at the University, are presented.en_US
dc.languageengen_US
dc.relation.ispartof2011 IEEE Global Engineering Education Conference, EDUCON 2011en_US
dc.source2011 IEEE Global Engineering Education Conference, EDUCON 2011 (5773173), p. 437-442en_US
dc.subject5802 Organización y planificación de la educaciónen_US
dc.subject.otherengineering educationen_US
dc.subject.otherpeer mentoringen_US
dc.subject.otherengineering student retentionen_US
dc.titleEvaluation of a peer Mentoring Program by Mentees after staying three years at the universityen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference2011 IEEE Global Engineering Education Conference, EDUCON 2011en_US
dc.identifier.doi10.1109/EDUCON.2011.5773173en_US
dc.identifier.scopus79960235628-
dc.contributor.authorscopusid6602389338-
dc.contributor.authorscopusid6603181073-
dc.description.lastpage442en_US
dc.identifier.issue5773173-
dc.description.firstpage437en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateJulio 2011en_US
dc.identifier.conferenceidevents121409-
dc.identifier.ulpgces
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-3379-5052-
crisitem.author.orcid0000-0002-1017-8107-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameTobajas Guerrero, Félix Bernardo-
crisitem.author.fullNameDe Armas Sosa, Valentín-
crisitem.event.eventsstartdate04-04-2011-
crisitem.event.eventsenddate06-04-2011-
Colección:Actas de congresos
miniatura
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