Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/48686
Title: Evaluation of thresholding techniques applied to oceanographic remote sensing imagery
Authors: Marcello, Javier 
Marqués, Ferran
Eugenio, Francisco 
UNESCO Clasification: 250616 Teledetección (Geología)
Keywords: Remote sensing
Image segmentation
Synthetic aperture radar
Satellites
Image sensors, et al
Issue Date: 2004
Journal: Proceedings of SPIE - The International Society for Optical Engineering 
Conference: Conference on Image and Signal Processing for Remote Sensing X 
Abstract: In many image processing applications, the gray levels of pixels belonging to the object are quite different from the levels belonging to the background. Thresholding becomes then a simple but effective tool to separate objects from the background. This segmentation tool is being used in many research and operational applications, so attempts to automate thresholding, has been a permanent area of interest. However, several difficulties impede to achieve in all the situations the desired results, so for any specific problem, the different techniques will have to be tested in order to select those providing the best performance.In this paper we have conducted a survey of image thresholding methods with a view to assess their performance when applied to remote sensing images and especially in oceanographic applications. Those algorithms have been categorized into two groups, local and global thresholding techniques, and the global ones again classified according to the information they are exploiting. This classification has lead to histogram shape-based methods, clustering-based methods, entropy-based methods, object attribute-based methods and spatial methods.After the application of a total of 36 techniques to visible, IR and microwave (synthetic aperture radar) remote sensing images, the optimum methods for each one have been selected.
URI: http://hdl.handle.net/10553/48686
ISSN: 0277-786X
DOI: 10.1117/12.565282
Source: Proceedings of SPIE - The International Society for Optical Engineering[ISSN 0277-786X],v. 5573 (09), p. 96-103
Appears in Collections:Actas de congresos
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