Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/48062
DC FieldValueLanguage
dc.contributor.authorAlvarez, L.en_US
dc.contributor.authorSocorro, F.en_US
dc.contributor.authorDe la Nuez Pestana, Ignacio Agustínen_US
dc.contributor.authorDe Rivera, M. Rodríguezen_US
dc.date.accessioned2018-11-23T18:39:20Z-
dc.date.available2018-11-23T18:39:20Z-
dc.date.issued2000en_US
dc.identifier.issn0040-6031en_US
dc.identifier.urihttp://hdl.handle.net/10553/48062-
dc.description.abstractInjection rate is the most relevant perturbing effect detected in the ThermoMetric TAM 2277-204 injection calorimeter. In other studies about this subject, several phenomenological expressions can be found. In this work, the connection between sensitivity and heat capacity C = ρcpv (ρ density, cp specific heat and v volume) and injection rate will be proved by physical models, using experimental values of the sensitivity, obtained from Joule effects. Sensitivity decreases when the injection rates and/or the specific heat of the liquids increase.en_US
dc.languageengen_US
dc.publisher0040-6031-
dc.relation.ispartofThermochimica Actaen_US
dc.sourceThermochimica Acta [ISSN 0040-6031], v. 344, p. 61-65en_US
dc.subject2213 Termodinámicaen_US
dc.subject220408 Líquidosen_US
dc.subject.otherConduction calorimetryen_US
dc.subject.otherFlow calorimetryen_US
dc.subject.otherLiquid mixturesen_US
dc.subject.otherModelingen_US
dc.subject.otherSignal processingen_US
dc.titleSensitivity changes with injection rate in heat-conduction calorimetersen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.relation.conference15th International Conference on Chemical Thermodynamics
dc.identifier.doi10.1016/S0040-6031(99)00327-5
dc.identifier.scopus0001993688-
dc.identifier.isi000084793000010
dc.contributor.authorscopusid57197007030-
dc.contributor.authorscopusid6603271349-
dc.contributor.authorscopusid6506614957-
dc.contributor.authorscopusid57202465692
dc.contributor.authorscopusid57202465692-
dc.description.lastpage65-
dc.description.firstpage61-
dc.relation.volume344-
dc.investigacionCienciasen_US
dc.type2Artículoen_US
dc.contributor.daisngid10238951
dc.contributor.daisngid1486637
dc.contributor.daisngid4413114
dc.contributor.daisngid2312735
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Alvarez, L
dc.contributor.wosstandardWOS:Socorro, F
dc.contributor.wosstandardWOS:de la Nuez, I
dc.contributor.wosstandardWOS:de Rivera, MR
dc.date.coverdateEnero 2000
dc.identifier.conferenceidevents120269
dc.identifier.ulpgces
dc.description.jcr0,807
dc.description.jcrqQ3
dc.description.scieSCIE
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.event.eventsstartdate26-07-1998-
crisitem.event.eventsenddate01-08-1998-
crisitem.author.deptGIR IUCTC: Centro de Innovación para la Sociedad de la Información-
crisitem.author.deptIU de Ciencias y Tecnologías Cibernéticas-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptGIR Termofísica de Líquidos y Calorimetría-
crisitem.author.deptDepartamento de Física-
crisitem.author.deptGIR Sistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR Termofísica de Líquidos y Calorimetría-
crisitem.author.deptDepartamento de Física-
crisitem.author.orcid0000-0002-4890-5947-
crisitem.author.orcid0000-0001-6652-2360-
crisitem.author.orcid0000-0002-6737-4096-
crisitem.author.parentorgIU de Ciencias y Tecnologías Cibernéticas-
crisitem.author.parentorgDepartamento de Física-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.parentorgDepartamento de Física-
crisitem.author.fullNameÁlvarez Álvarez, Luis Antonio-
crisitem.author.fullNameSocorro Lorenzo, Fabiola Lourdes-
crisitem.author.fullNameDe La Nuez Pestana, Ignacio Agustín-
crisitem.author.fullNameRodríguez De Rivera Rodríguez, Manuel Jose M.-
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