Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/45454
DC FieldValueLanguage
dc.contributor.authorCastagnola, Juan Luisen_US
dc.contributor.authorDualibe, Fortunato Carlosen_US
dc.contributor.authorGarcía-Vázquez, Hugoen_US
dc.date.accessioned2018-11-22T09:58:16Z-
dc.date.available2018-11-22T09:58:16Z-
dc.date.issued2017en_US
dc.identifier.isbn9781509009169en_US
dc.identifier.issn1548-3746en_US
dc.identifier.urihttp://hdl.handle.net/10553/45454-
dc.description.abstractThis work presents a design methodology for RF circuits. It is based on the transistor physics, provided by the MOS advanced compact model (ACM) and the scattering parameters, which have been expressed in function of the transconductance-to-current ratio (g m /I D ) of MOS transistors. Since the scattering parameters of the circuits are parameterized by means of the g m /I D ratios of MOST, designers can choose the latter in order to optimise transistor size and bias to comply with the circuit specs, which are normally given in terms of the scattering parameters. As an example, this method has been applied for designing the common source stage of a low noise amplifier (LNA).en_US
dc.languageengen_US
dc.publisher1548-3746en_US
dc.relation.ispartofMidwest Symposium on Circuits and Systemsen_US
dc.sourceMidwest Symposium on Circuits and Systems[ISSN 1548-3746] (7870068)en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherScattering parametersen_US
dc.subject.otherTransistorsen_US
dc.subject.otherIntegrated circuit modelingen_US
dc.subject.otherCircuit stabilityen_US
dc.subject.otherStability analysisen_US
dc.subject.otherCapacitanceen_US
dc.subject.otherMathematical modelen_US
dc.titleUsing scattering parameters and the gm/ID MOST ratio for characterisation and design of RF circuitsen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.identifier.doi10.1109/MWSCAS.2016.7870068en_US
dc.identifier.scopus85015956921-
dc.contributor.authorscopusid23049372300-
dc.contributor.authorscopusid6603172494-
dc.contributor.authorscopusid36639352800-
dc.identifier.issue7870068-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.identifier.ulpgces
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.orcid0000-0003-0942-5761-
crisitem.author.fullNameGarcía Vázquez, Hugo-
Appears in Collections:Actas de congresos
Show simple item record

Google ScholarTM

Check

Altmetric


Share



Export metadata



Items in accedaCRIS are protected by copyright, with all rights reserved, unless otherwise indicated.