Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/45370
DC FieldValueLanguage
dc.contributor.authorFernández, E.en_US
dc.contributor.authorBeriain, A.en_US
dc.contributor.authorSolar, H.en_US
dc.contributor.authorRebollo, I.en_US
dc.contributor.authorGarcía-Alonso, A.en_US
dc.contributor.authorSosa, J.en_US
dc.contributor.authorMonzón, J. M.en_US
dc.contributor.authorGarcia-Alonso, Santiagoen_US
dc.contributor.authorMontiel-Nelson, J. A.en_US
dc.contributor.authorBerenguer, R.en_US
dc.contributor.otherSolar, Hector-
dc.contributor.otherBerenguer, Roc-
dc.contributor.otherBeriain, Andoni-
dc.contributor.otherMontiel-Nelson, Juan-
dc.contributor.otherSosa, Javier-
dc.date.accessioned2018-11-22T09:18:45Z-
dc.date.available2018-11-22T09:18:45Z-
dc.date.issued2012en_US
dc.identifier.issn0026-2692en_US
dc.identifier.urihttp://hdl.handle.net/10553/45370-
dc.description.abstractThis paper presents a low power voltage limiter design for avoiding possible damages in the analog front-end of a RFID sensor due to voltage surges whenever readers and tags are close. The proposed voltage limiter design takes advantage of the implemented bandgap reference and voltage regulator blocks in order to provide low deviation of the limiting voltage due to temperature variation and process dispersion. The measured limiting voltage is 2.9 V with a voltage deviation of only ±0.065 V for the 12 measured dies. The measured current consumption is only 150 nA when the reader and the tag are far away, not limiting the sensitivity of the tag due to an undesired consumption in the voltage limiter. The circuit is implemented on a low cost 2P4M 0.35 μm CMOS technology.-
dc.languageengen_US
dc.relation.ispartofMicroelectronicsen_US
dc.sourceMicroelectronics [ISSN 0026-2692], v. 43 (10), p. 708-713, (Octubre 2012)en_US
dc.subject330790 Microelectrónica-
dc.subject.otherVoltage limiter-
dc.subject.otherRFID sensor-
dc.subject.otherCMOS-
dc.titleA low power voltage limiter for a full passive UHF RFID sensor on a 0.35 μm CMOS processen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.relation.conferenceIEEE International Midwest Symposium on Circuits and Systems (MWSCAS)en_US
dc.identifier.doi10.1016/j.mejo.2012.03.013en_US
dc.identifier.scopus84864965026-
dc.identifier.isi000308841600006-
dcterms.isPartOfMicroelectronics Journal-
dcterms.sourceMicroelectronics Journal [ISSN 0026-2692], v. 43 (10), p. 708-713-
dc.contributor.authorscopusid55713506800-
dc.contributor.authorscopusid36995977900-
dc.contributor.authorscopusid8694665700-
dc.contributor.authorscopusid37021734500-
dc.contributor.authorscopusid56208174700-
dc.contributor.authorscopusid56231679300-
dc.contributor.authorscopusid36145204700-
dc.contributor.authorscopusid35106946100-
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid6602293949-
dc.description.lastpage713en_US
dc.identifier.issue10-
dc.description.firstpage708en_US
dc.relation.volume43en_US
dc.investigacionIngeniería y Arquitectura-
dc.type2Artículoen_US
dc.identifier.wosWOS:000308841600006-
dc.contributor.daisngid28355379-
dc.contributor.daisngid28460821-
dc.contributor.daisngid3005559-
dc.contributor.daisngid819370-
dc.contributor.daisngid28250609-
dc.contributor.daisngid3672135-
dc.contributor.daisngid2917809-
dc.contributor.daisngid428868-
dc.contributor.daisngid1739656-
dc.contributor.daisngid4279991-
dc.contributor.daisngid3654087-
dc.contributor.daisngid480589-
dc.contributor.daisngid548733-
dc.identifier.investigatorRIDI-3290-2015-
dc.identifier.investigatorRIDL-8970-2014-
dc.identifier.investigatorRIDL-8609-2014-
dc.identifier.investigatorRIDK-6805-2013-
dc.identifier.investigatorRIDL-8617-2014-
dc.utils.revision-
dc.contributor.wosstandardWOS:Fernandez, E-
dc.contributor.wosstandardWOS:Beriain, A-
dc.contributor.wosstandardWOS:Solar, H-
dc.contributor.wosstandardWOS:Rebollo, I-
dc.contributor.wosstandardWOS:Garcia-Alonso, A-
dc.contributor.wosstandardWOS:Sosa, J-
dc.contributor.wosstandardWOS:Monzon, JM-
dc.contributor.wosstandardWOS:Garcia-Alonso, S-
dc.contributor.wosstandardWOS:Montiel-Nelson, JA-
dc.contributor.wosstandardWOS:Berenguer, R-
dc.date.coverdateOctubre 2012en_US
dc.identifier.conferenceidevents120799-
dc.identifier.ulpgc-
dc.description.jcr0,912-
dc.description.jcrqQ3-
dc.description.scieSCIE-
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Eléctrica-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.orcid0000-0001-9694-269X-
crisitem.author.orcid0000-0003-4389-0632-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSosa González, Carlos Javier-
crisitem.author.fullNameMonzón Verona, José Miguel-
crisitem.author.fullNameGarcia-Alonso Montoya, Santiago-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
crisitem.event.eventsstartdate07-04-2011-
crisitem.event.eventsenddate10-04-2011-
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