Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/45082
DC FieldValueLanguage
dc.contributor.authorMontiel-Nelson, J. A.en_US
dc.contributor.authorDe Armas, V.en_US
dc.contributor.authorSarmiento, R.en_US
dc.contributor.authorNunez, A.en_US
dc.contributor.otherSarmiento, Roberto-
dc.contributor.otherMontiel-Nelson, Juan A.-
dc.date.accessioned2018-11-22T07:07:53Z-
dc.date.available2018-11-22T07:07:53Z-
dc.date.issued1998en_US
dc.identifier.isbn0-8186-8359-7en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/10553/45082-
dc.description.abstractA gallium arsenide automated layout generation system (OLYMPO) for SSI, MSI and LSI circuits used in GaAs VLSI design has been developed. We introduce a full-custom layout style, called RN-based cell model, that it is suited to generate low self-inductance circuit layouts of cells and macrocells. The cell compiler can be used as a cell library builder and it is embedded in a random logic macrocell and an iterative logic array generator. Experimental results demonstrate that OLYMPO generates complex and compact layouts and the synthesis process can be interactively used at the system design level.en_US
dc.languageengen_US
dc.relation.ispartofProceedings -Design, Automation and Test in Europe, DATEen_US
dc.sourceProceedings -Design, Automation and Test in Europe, DATE[ISSN 1530-1591] (655982), p. 947-948en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherGallium arsenideen_US
dc.subject.otherMacrocell networksen_US
dc.subject.otherVery large scale integrationen_US
dc.subject.otherRoutingen_US
dc.subject.otherPower suppliesen_US
dc.subject.otherFinite impulse response filteren_US
dc.subject.otherRailsen_US
dc.titleA cell and macrocell compiler for GaAs VLSI full-custom designen_US
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.relation.conferenceDesign, Automation and Test in Europe Conference (DATE98)
dc.relation.conferenceDesign, Automation and Test in Europe, DATE 1998
dc.identifier.doi10.1109/DATE.1998.655982
dc.identifier.scopus0042032272-
dc.identifier.isi000072439300152-
dcterms.isPartOfDesign, Automation And Test In Europe, Proceedings
dcterms.sourceDesign, Automation And Test In Europe, Proceedings, p. 947-948
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid6603181073-
dc.contributor.authorscopusid35609452100-
dc.contributor.authorscopusid7103279517-
dc.description.lastpage948-
dc.identifier.issue655982-
dc.description.firstpage947-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000072439300152-
dc.contributor.daisngid480589-
dc.contributor.daisngid13379932
dc.contributor.daisngid1262195-
dc.contributor.daisngid116294-
dc.contributor.daisngid33795-
dc.contributor.daisngid7494592
dc.identifier.investigatorRIDL-6017-2014-
dc.identifier.investigatorRIDNo ID-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Montiel-Nelson, JA
dc.contributor.wosstandardWOS:de Armas, V
dc.contributor.wosstandardWOS:Sarmiento, R
dc.contributor.wosstandardWOS:Nunez, A
dc.date.coverdateDiciembre 1998
dc.identifier.conferenceidevents120230
dc.identifier.ulpgces
dc.description.ggs2
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.orcid0000-0002-4843-0507-
crisitem.author.orcid0000-0003-1295-1594-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
crisitem.author.fullNameSarmiento Rodríguez, Roberto-
crisitem.author.fullNameNúñez Ordóñez, Antonio-
crisitem.event.eventsstartdate23-02-1998-
crisitem.event.eventsstartdate23-02-1998-
crisitem.event.eventsenddate26-02-1998-
crisitem.event.eventsenddate26-02-1998-
Appears in Collections:Actas de congresos
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