Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/45054
Campo DC Valoridioma
dc.contributor.authorMontiel-Nelson, J. A.en_US
dc.contributor.authorSosa, J.en_US
dc.contributor.authorNavarro, H.en_US
dc.contributor.authorSarmiento, R.en_US
dc.contributor.authorNúñez, A.en_US
dc.contributor.otherMontiel-Nelson, Juan-
dc.contributor.otherSosa, Javier-
dc.date.accessioned2018-11-22T06:55:09Z-
dc.date.available2018-11-22T06:55:09Z-
dc.date.issued2005en_US
dc.identifier.issn1350-2409en_US
dc.identifier.urihttp://hdl.handle.net/10553/45054-
dc.description.abstractThe authors are concerned with the optimisation of combinational logic circuits. The competing factors, active area and delay time, are considered in the optimisation. The total active area is assumed to be a linear function of the gate sizes. There is a critical path whose delay time, the longest delay time of the circuit, depends on the sizes of the individual gates. This path will change many times during the optimisation. The optimisation process is used to produce the tradeoff curve. The proposed methodology is based on the optimisation of the circuit critical path. This is a gate sizing problem on those paths that define the delay time of a circuit. Given a drive size for all the gates of the circuit, the trade-off curve contains design space points of minimum delay time and active area. A variable-sized subset of the Boolean network is optimised. Only the gates in the circuit critical path are optimised. The gates in the Boolean network which are not in the critical path do not need to be optimised. An efficient method is proposed for updating the critical path as the trade-off curve is obtained. Performance comparison and results were obtained over the set of MCNC two-level and combinational multilevel benchmark circuits. The proposed methodology produces trade-off curves, in relatively large circuits, with a great reduction in number of variables and run-time compared with the original full problem. In the proposed method, the number of variables is reduced by a factor of up to 7.3 times relative to the original full problem. The run-time behaviour is excellent, with an improvement between 1.5 and 32.5 times less CPU time compared with computation of the full Boolean network. With a higher gate count of the circuit, there are greater improvements in both run-time and number of variables.en_US
dc.languageengen_US
dc.relation.ispartofIEE Proceedings: Circuits, Devices and Systemsen_US
dc.sourceIEE Proceedings: Circuits, Devices and Systems[ISSN 1350-2409],v. 152, p. 133-145en_US
dc.subject3307 Tecnología electrónicaen_US
dc.subject.otherCircuit optimisationen_US
dc.subject.otherCombinational circuitsen_US
dc.subject.otherLogic gatesen_US
dc.subject.otherDelayen_US
dc.subject.otherIntegrated logic circuitsen_US
dc.subject.otherlinear programmingen_US
dc.subject.otherMultivalued logic circuitsen_US
dc.titleEfficient method to obtain the entire active area against circuit delay time trade-off curve in gate sizingen_US
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.identifier.doi10.1049/ip-cds:20040779
dc.identifier.scopus20444431574-
dc.identifier.isi000229749000008-
dcterms.isPartOfIee Proceedings-Circuits Devices And Systems
dcterms.sourceIee Proceedings-Circuits Devices And Systems[ISSN 1350-2409],v. 152 (2), p. 133-145
dc.contributor.authorscopusid6603626866-
dc.contributor.authorscopusid56231679300-
dc.contributor.authorscopusid23028289000-
dc.contributor.authorscopusid35609452100-
dc.contributor.authorscopusid7103279517-
dc.description.lastpage145-
dc.description.firstpage133-
dc.relation.volume152-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.identifier.wosWOS:000229749000008-
dc.contributor.daisngid480589-
dc.contributor.daisngid1739656-
dc.contributor.daisngid1510114-
dc.contributor.daisngid15263850
dc.contributor.daisngid116294-
dc.contributor.daisngid7494592
dc.contributor.daisngid33795-
dc.identifier.investigatorRIDK-6805-2013-
dc.identifier.investigatorRIDL-8617-2014-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Montiel-Nelson, JA
dc.contributor.wosstandardWOS:Sosa, J
dc.contributor.wosstandardWOS:Navarro, H
dc.contributor.wosstandardWOS:Sarmiento, R
dc.contributor.wosstandardWOS:Nunez, A
dc.date.coverdateAbril 2005
dc.identifier.ulpgces
dc.description.jcr0,638
dc.description.jcrqQ3
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Instrumentación avanzada-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-4323-8097-
crisitem.author.orcid0000-0003-1838-3073-
crisitem.author.orcid0000-0002-4843-0507-
crisitem.author.orcid0000-0003-1295-1594-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameMontiel Nelson, Juan Antonio-
crisitem.author.fullNameSosa González, Carlos Javier-
crisitem.author.fullNameSarmiento Rodríguez, Roberto-
crisitem.author.fullNameNúñez Ordóñez, Antonio-
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