Identificador persistente para citar o vincular este elemento:
http://hdl.handle.net/10553/45054
Campo DC | Valor | idioma |
---|---|---|
dc.contributor.author | Montiel-Nelson, J. A. | en_US |
dc.contributor.author | Sosa, J. | en_US |
dc.contributor.author | Navarro, H. | en_US |
dc.contributor.author | Sarmiento, R. | en_US |
dc.contributor.author | Núñez, A. | en_US |
dc.contributor.other | Montiel-Nelson, Juan | - |
dc.contributor.other | Sosa, Javier | - |
dc.date.accessioned | 2018-11-22T06:55:09Z | - |
dc.date.available | 2018-11-22T06:55:09Z | - |
dc.date.issued | 2005 | en_US |
dc.identifier.issn | 1350-2409 | en_US |
dc.identifier.uri | http://hdl.handle.net/10553/45054 | - |
dc.description.abstract | The authors are concerned with the optimisation of combinational logic circuits. The competing factors, active area and delay time, are considered in the optimisation. The total active area is assumed to be a linear function of the gate sizes. There is a critical path whose delay time, the longest delay time of the circuit, depends on the sizes of the individual gates. This path will change many times during the optimisation. The optimisation process is used to produce the tradeoff curve. The proposed methodology is based on the optimisation of the circuit critical path. This is a gate sizing problem on those paths that define the delay time of a circuit. Given a drive size for all the gates of the circuit, the trade-off curve contains design space points of minimum delay time and active area. A variable-sized subset of the Boolean network is optimised. Only the gates in the circuit critical path are optimised. The gates in the Boolean network which are not in the critical path do not need to be optimised. An efficient method is proposed for updating the critical path as the trade-off curve is obtained. Performance comparison and results were obtained over the set of MCNC two-level and combinational multilevel benchmark circuits. The proposed methodology produces trade-off curves, in relatively large circuits, with a great reduction in number of variables and run-time compared with the original full problem. In the proposed method, the number of variables is reduced by a factor of up to 7.3 times relative to the original full problem. The run-time behaviour is excellent, with an improvement between 1.5 and 32.5 times less CPU time compared with computation of the full Boolean network. With a higher gate count of the circuit, there are greater improvements in both run-time and number of variables. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | IEE Proceedings: Circuits, Devices and Systems | en_US |
dc.source | IEE Proceedings: Circuits, Devices and Systems[ISSN 1350-2409],v. 152, p. 133-145 | en_US |
dc.subject | 3307 Tecnología electrónica | en_US |
dc.subject.other | Circuit optimisation | en_US |
dc.subject.other | Combinational circuits | en_US |
dc.subject.other | Logic gates | en_US |
dc.subject.other | Delay | en_US |
dc.subject.other | Integrated logic circuits | en_US |
dc.subject.other | linear programming | en_US |
dc.subject.other | Multivalued logic circuits | en_US |
dc.title | Efficient method to obtain the entire active area against circuit delay time trade-off curve in gate sizing | en_US |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dc.type | ConferenceObject | es |
dc.identifier.doi | 10.1049/ip-cds:20040779 | |
dc.identifier.scopus | 20444431574 | - |
dc.identifier.isi | 000229749000008 | - |
dcterms.isPartOf | Iee Proceedings-Circuits Devices And Systems | |
dcterms.source | Iee Proceedings-Circuits Devices And Systems[ISSN 1350-2409],v. 152 (2), p. 133-145 | |
dc.contributor.authorscopusid | 6603626866 | - |
dc.contributor.authorscopusid | 56231679300 | - |
dc.contributor.authorscopusid | 23028289000 | - |
dc.contributor.authorscopusid | 35609452100 | - |
dc.contributor.authorscopusid | 7103279517 | - |
dc.description.lastpage | 145 | - |
dc.description.firstpage | 133 | - |
dc.relation.volume | 152 | - |
dc.investigacion | Ingeniería y Arquitectura | en_US |
dc.type2 | Actas de congresos | en_US |
dc.identifier.wos | WOS:000229749000008 | - |
dc.contributor.daisngid | 480589 | - |
dc.contributor.daisngid | 1739656 | - |
dc.contributor.daisngid | 1510114 | - |
dc.contributor.daisngid | 15263850 | |
dc.contributor.daisngid | 116294 | - |
dc.contributor.daisngid | 7494592 | |
dc.contributor.daisngid | 33795 | - |
dc.identifier.investigatorRID | K-6805-2013 | - |
dc.identifier.investigatorRID | L-8617-2014 | - |
dc.utils.revision | Sí | en_US |
dc.contributor.wosstandard | WOS:Montiel-Nelson, JA | |
dc.contributor.wosstandard | WOS:Sosa, J | |
dc.contributor.wosstandard | WOS:Navarro, H | |
dc.contributor.wosstandard | WOS:Sarmiento, R | |
dc.contributor.wosstandard | WOS:Nunez, A | |
dc.date.coverdate | Abril 2005 | |
dc.identifier.ulpgc | Sí | es |
dc.description.jcr | 0,638 | |
dc.description.jcrq | Q3 | |
item.grantfulltext | none | - |
item.fulltext | Sin texto completo | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Instrumentación avanzada | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.dept | GIR IUMA: Sistemas de Información y Comunicaciones | - |
crisitem.author.dept | IU de Microelectrónica Aplicada | - |
crisitem.author.dept | Departamento de Ingeniería Electrónica y Automática | - |
crisitem.author.orcid | 0000-0003-4323-8097 | - |
crisitem.author.orcid | 0000-0003-1838-3073 | - |
crisitem.author.orcid | 0000-0002-4843-0507 | - |
crisitem.author.orcid | 0000-0003-1295-1594 | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.parentorg | IU de Microelectrónica Aplicada | - |
crisitem.author.fullName | Montiel Nelson, Juan Antonio | - |
crisitem.author.fullName | Sosa González, Carlos Javier | - |
crisitem.author.fullName | Sarmiento Rodríguez, Roberto | - |
crisitem.author.fullName | Núñez Ordóñez, Antonio | - |
Colección: | Actas de congresos |
Citas SCOPUSTM
5
actualizado el 10-nov-2024
Citas de WEB OF SCIENCETM
Citations
4
actualizado el 10-nov-2024
Visitas
103
actualizado el 24-ago-2024
Google ScholarTM
Verifica
Altmetric
Comparte
Exporta metadatos
Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.