Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/44521
Campo DC Valoridioma
dc.contributor.authorGonzález, Luisen_US
dc.date.accessioned2018-11-22T00:17:46Z-
dc.date.available2018-11-22T00:17:46Z-
dc.date.issued2002en_US
dc.identifier.isbn978-3-540-43591-4en_US
dc.identifier.isbn3540435913
dc.identifier.issn0302-9743en_US
dc.identifier.urihttp://hdl.handle.net/10553/44521-
dc.description.abstractA new method is proposed to select the binary n-tuples of 0s and 1s by decreasing order of there occurrence probabilities in stochastic Boolean models. This method can be applied to evaluate fault trees in Reliability Engineering and Risk Analysis, as well as to many other problems described by a stochastic Boolean structure. The selecting criterion is exclusively based on the positions of 0s and 1s in the binary n-tuples. In this way, the computational cost in sorting algorithms is drastically reduced, because the proposed criterion is independent of the probabilities of the Boolean variables. Every step, the algorithm extends the set of selected binary states, obtaining the binary n-tuples just by adding 0 (1) at the end of all the (some) previously selected binary n — 1-tuples.en_US
dc.languageengen_US
dc.relation.ispartofLecture Notes in Computer Scienceen_US
dc.sourceSloot P.M.A., Hoekstra A.G., Tan C.J.K., Dongarra J.J. (eds) Computational Science — ICCS 2002. ICCS 2002. Lecture Notes in Computer Science, vol 2329. Springer, Berlin, Heidelbergen_US
dc.subject12 Matemáticasen_US
dc.subject.otherRisk Analysisen_US
dc.subject.otherBoolean Functionen_US
dc.subject.otherOccurrence Probabilityen_US
dc.subject.otherElementary Stateen_US
dc.subject.otherBoolean Variableen_US
dc.titleA new method for ordering binary states probabilities in reliability and risk analysisen_US
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.relation.conferenceInternational Conference on Computational Science
dc.relation.conferenceInternational Conference on Computational Science, ICCS 2002
dc.identifier.doi10.1007/3-540-46043-8_13en_US
dc.identifier.scopus33745945556-
dc.identifier.isi000181350500013-
dc.contributor.authorscopusid35248076500-
dc.description.lastpage146-
dc.description.firstpage137-
dc.relation.volume2329-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.contributor.daisngid1802854
dc.identifier.eisbn978-3-540-46043-5-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Gonzalez, L
dc.date.coverdateDiciembre 2002
dc.identifier.conferenceidevents120344
dc.identifier.ulpgces
dc.description.jcr0,515
dc.description.jcrqQ3
dc.description.ggs3
item.grantfulltextnone-
item.fulltextSin texto completo-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.fullNameGonzález Sánchez, Luis-
crisitem.event.eventsstartdate21-04-2002-
crisitem.event.eventsstartdate21-04-2002-
crisitem.event.eventsenddate24-04-2002-
crisitem.event.eventsenddate24-04-2002-
Colección:Actas de congresos
Vista resumida

Google ScholarTM

Verifica

Altmetric


Comparte



Exporta metadatos



Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.