Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/43834
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dc.contributor.authorQuintana, J. J.
dc.contributor.authorRamos, A.
dc.contributor.authorNuez, I.
dc.date.accessioned2018-11-21T18:11:18Z-
dc.date.available2018-11-21T18:11:18Z-
dc.date.issued2006
dc.identifier.isbn9783902661128
dc.identifier.issn1474-6670
dc.identifier.urihttp://hdl.handle.net/10553/43834-
dc.description.abstractUltracapacitor are devices used to store energy in which diffusion phenomena are important. This paper obtains an identification of a double layer ultracapacitor using impedance spectroscopy. It has been observed from experimental data, that the ultracapacitor has a fractional behaviour. In order to get a good accuracy, conventional models use a lot of parameters. This paper proposes the two novel methods modelling ultracapacitors in the frequency domain, based on the fractional calculus with a few parameters. Copyright © 2006 IFAC.
dc.publisher1474-6670
dc.relation.ispartofIFAC Proceedings Volumes (IFAC-PapersOnline)
dc.sourceIFAC Proceedings Volumes (IFAC-PapersOnline)[ISSN 1474-6670],v. 2, p. 432-436
dc.titleIdentification of the fractional impedance of ultracapacitors
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dc.typeConferenceObjectes
dc.relation.conference2nd IFAC Workshop on Fractional Differentiation and its Applications, FDA 2006
dc.identifier.scopus79961119438
dc.contributor.authorscopusid24341642700
dc.contributor.authorscopusid24341941100
dc.contributor.authorscopusid23392958400
dc.description.lastpage436
dc.description.firstpage432
dc.relation.volume2
dc.type2Actas de congresoses
dc.date.coverdateDiciembre 2006
dc.identifier.conferenceidevents121411
dc.identifier.ulpgces
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptSistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptSistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0003-1166-6257-
crisitem.author.orcid0000-0001-5759-4469-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameQuintana Hernández, José Juan-
crisitem.author.fullNameRamos Martín, Alejandro-
crisitem.event.eventsstartdate19-07-2006-
crisitem.event.eventsenddate21-07-2006-
Appears in Collections:Actas de congresos
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