Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/43612
DC FieldValueLanguage
dc.contributor.authorMartin, Rodolfo
dc.contributor.authorQuintana, Jose J.
dc.contributor.authorRamos, Alejandro
dc.contributor.authorNuez, Ignacio
dc.date.accessioned2018-11-21T16:32:01Z-
dc.date.available2018-11-21T16:32:01Z-
dc.date.issued2008
dc.identifier.issn1269-6935
dc.identifier.urihttp://hdl.handle.net/10553/43612-
dc.description.abstractThis paper provides a Fractional Equivalent Impedance for combinations of Electrochemical Double Layer Capacitors (EDLCs). The application of the fractional calculus for modeling EDLCs is a novel way to get simpler and more precise models. On using the impedance spectroscopy method, experimental results for different EDLC combinations have been obtained. It has been developed a model which characterizes any EDLC combinations, series or parallel, of the same manufacturer. It is exposed that for the same manufacturer technology the proposed model is only a function of the capacity. The results obtained show an excellent fitting on the overall frequencies analyzed. © 2008 Lavoisier, Paris.
dc.publisher1269-6935
dc.relation.ispartofJournal Europeen des Systemes Automatises
dc.sourceJournal Europeen des Systemes Automatises[ISSN 1269-6935],v. 42, p. 923-938
dc.titleFractional equivalent impedance of electrochemical double layer capacitors combinations
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.3166/JESA.42.923-938
dc.identifier.scopus77954277582-
dc.contributor.authorscopusid23094981500
dc.contributor.authorscopusid24341642700
dc.contributor.authorscopusid24341941100
dc.contributor.authorscopusid23392958400
dc.description.lastpage938
dc.description.firstpage923
dc.relation.volume42
dc.type2Artículoes
dc.date.coverdateDiciembre 2008
dc.identifier.ulpgces
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptSistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptSistemas industriales de eficiciencia, instrumentación y protección-
crisitem.author.deptDepartamento de Ingeniería de Procesos-
crisitem.author.orcid0000-0003-1166-6257-
crisitem.author.orcid0000-0001-5759-4469-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.parentorgDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.fullNameMartín Hernández, Rodolfo-
crisitem.author.fullNameQuintana Hernández, José Juan-
crisitem.author.fullNameRamos Martín, Alejandro-
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