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https://accedacris.ulpgc.es/handle/10553/42737
Title: | Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light | Authors: | Albella Echave, Pablo Saiz, J. M. Sanz, J. M. González, F. Moreno, F. |
Issue Date: | 2009 | Journal: | Optics Letters | Abstract: | We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface. | URI: | https://accedacris.ulpgc.es/handle/10553/42737 | ISSN: | 0146-9592 | DOI: | 10.1364/OL.34.001906 | Source: | Optics Letters [ISSN 0146-9592], v. 34, p. 1906-1908, (2009) |
Appears in Collections: | Artículos |
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