Please use this identifier to cite or link to this item: https://accedacris.ulpgc.es/handle/10553/42737
Title: Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light
Authors: Albella Echave, Pablo 
Saiz, J. M.
Sanz, J. M.
González, F.
Moreno, F.
Issue Date: 2009
Journal: Optics Letters 
Abstract: We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.
URI: https://accedacris.ulpgc.es/handle/10553/42737
ISSN: 0146-9592
DOI: 10.1364/OL.34.001906
Source: Optics Letters [ISSN 0146-9592], v. 34, p. 1906-1908, (2009)
Appears in Collections:Artículos
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