Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/42515
DC FieldValueLanguage
dc.contributor.authorAbad, Pilaren_US
dc.contributor.authorSuárez, José P.en_US
dc.contributor.otherSuarez, Jose Pablo-
dc.date.accessioned2018-11-19T16:46:47Z-
dc.date.available2018-11-19T16:46:47Z-
dc.date.issued2004en_US
dc.identifier.issn0377-0427en_US
dc.identifier.urihttp://hdl.handle.net/10553/42515-
dc.description.abstractA great variety of causes are implied in the resolution of GPS equations systems for obtaining precise point positioning. Among them, the time interval between observations and the number of observations are relevant to know the influence in positioning unknowns (X,Y,Z). In this paper, we perform a statistical study showing the possible influence of both factors in the obtained solution. From the results of this paper we conclude that the X and Y solution are independent of the above factors; however, Z shows a significant effect in the manner that time interval and the number of observations are chosen. The results provide insight into the most appropriate design for solving the equation systems of GPS observations. © 2003 Elsevier B.V. All rights reserved.en_US
dc.languagespaen_US
dc.relation.ispartofJournal of Computational and Applied Mathematicsen_US
dc.sourceJournal of Computational and Applied Mathematics[ISSN 0377-0427],v. 164-165, p. 1-10en_US
dc.subject54 Geografíaen_US
dc.subject331117 Equipos de verificaciónen_US
dc.subject331115 Técnicas de manipulación a distanciaen_US
dc.subject3324 Tecnología del espacioen_US
dc.subject332506 Comunicaciones por satéliteen_US
dc.titleBi-factorial analysis for resolution of GPS equationsen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.relation.conference10th International Congress on Computational and Applied Mathematics
dc.identifier.doi10.1016/j.cam.2003.11.006en_US
dc.identifier.scopus1442289607-
dc.identifier.isi000220099900002-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/1442289607-
dc.contributor.authorscopusid57196535626-
dc.contributor.authorscopusid7202040282-
dc.description.lastpage10en_US
dc.description.firstpage1en_US
dc.relation.volume164-165en_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000220099900002-
dc.contributor.daisngid1500747-
dc.contributor.daisngid1080382-
dc.identifier.investigatorRIDC-1092-2012-
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Abad, P-
dc.contributor.wosstandardWOS:Suarez, JP-
dc.date.coverdateMarzo 2004en_US
dc.identifier.conferenceidevents120397-
dc.identifier.ulpgcen_US
dc.description.jcr0,486
dc.description.jcrqQ3
dc.description.scieSCIE
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.event.eventsstartdate22-07-2002-
crisitem.event.eventsenddate26-07-2002-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameAbad Real, María Pilar-
crisitem.author.fullNameSuárez Rivero, José Pablo-
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