Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/41833
DC FieldValueLanguage
dc.contributor.authorFabelo, Himaren_US
dc.contributor.authorOrtega, Samuelen_US
dc.contributor.authorLazcano, Raquelen_US
dc.contributor.authorMadroñal, Danielen_US
dc.contributor.authorCallicó, Gustavo M.en_US
dc.contributor.authorJuárez, Eduardoen_US
dc.contributor.authorSalvador, Rubénen_US
dc.contributor.authorBulters, Diederiken_US
dc.contributor.authorBulstrode, Harryen_US
dc.contributor.authorSzolna, Adamen_US
dc.contributor.authorPiñeiro, Juan F.en_US
dc.contributor.authorSosa, Coraliaen_US
dc.contributor.authorO'Shanahan, Aruma J.en_US
dc.contributor.authorBisshopp, Saraen_US
dc.contributor.authorHernández, Maríaen_US
dc.contributor.authorMorera, Jesúsen_US
dc.contributor.authorRavi, Danieleen_US
dc.contributor.authorKiran, B. Ravien_US
dc.contributor.authorVega Martínez, Aurelioen_US
dc.contributor.authorBaez Quevedo, Abelardoen_US
dc.contributor.authorYang, Guang-Zhongen_US
dc.contributor.authorStanciulescu, Bogdanen_US
dc.contributor.authorSarmiento, Robertoen_US
dc.date.accessioned2018-09-04T11:57:03Z-
dc.date.available2018-09-04T11:57:03Z-
dc.date.issued2018en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://hdl.handle.net/10553/41833-
dc.description.abstractHyperspectral imaging (HSI) allows for the acquisition of large numbers of spectral bands throughout the electromagnetic spectrum (within and beyond the visual range) with respect to the surface of scenes captured by sensors. Using this information and a set of complex classification algorithms, it is possible to determine which material or substance is located in each pixel. The work presented in this paper aims to exploit the characteristics of HSI to develop a demonstrator capable of delineating tumor tissue from brain tissue during neurosurgical operations. Improved delineation of tumor boundaries is expected to improve the results of surgery. The developed demonstrator is composed of two hyperspectral cameras covering a spectral range of 400-1700 nm. Furthermore, a hardware accelerator connected to a control unit is used to speed up the hyperspectral brain cancer detection algorithm to achieve processing during the time of surgery. A labeled dataset comprised of more than 300,000 spectral signatures is used as the training dataset for the supervised stage of the classification algorithm. In this preliminary study, thematic maps obtained from a validation database of seven hyperspectral images of in vivo brain tissue captured and processed during neurosurgical operations demonstrate that the system is able to discriminate between normal and tumor tissue in the brain. The results can be provided during the surgical procedure (similar to 1 min), making it a practical system for neurosurgeons to use in the near future to improve excision and potentially improve patient outcomes.en_US
dc.languageengen_US
dc.relation.ispartofSensorsen_US
dc.sourceSensors (Switzerland)[ISSN 1424-8220],v. 18 (430)en_US
dc.subject220921 Espectroscopiaen_US
dc.subject3314 Tecnología médicaen_US
dc.subject.otherHyperspectral imaging instrumentationen_US
dc.subject.otherBrain cancer detectionen_US
dc.subject.otherImage processingen_US
dc.titleAn intraoperative visualization system using hyperspectral imaging to aid in brain tumor delineationen_US
dc.typeinfo:eu-repo/semantics/Articlees
dc.typeArticlees
dc.identifier.doi10.3390/s18020430
dc.identifier.scopus85041516227
dc.identifier.isi000427544000113-
dc.contributor.authorscopusid56405568500
dc.contributor.authorscopusid57189334144
dc.contributor.authorscopusid57192839213
dc.contributor.authorscopusid57192829417
dc.contributor.authorscopusid56006321500
dc.contributor.authorscopusid36447485600
dc.contributor.authorscopusid23005852100
dc.contributor.authorscopusid23018247600
dc.contributor.authorscopusid48861007100
dc.contributor.authorscopusid14032568700
dc.contributor.authorscopusid57189323824
dc.contributor.authorscopusid57200524989
dc.contributor.authorscopusid57200532309
dc.contributor.authorscopusid57200531623
dc.contributor.authorscopusid8616779200
dc.contributor.authorscopusid35466252100
dc.contributor.authorscopusid57201696886
dc.contributor.authorscopusid55347916400
dc.contributor.authorscopusid56405149600
dc.contributor.authorscopusid57200527135
dc.contributor.authorscopusid55539304100
dc.contributor.authorscopusid7801353541
dc.contributor.authorscopusid35609452100
dc.identifier.issue2-
dc.relation.volume18-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngid2096372
dc.contributor.daisngid1812298
dc.contributor.daisngid3634522
dc.contributor.daisngid3360488
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dc.contributor.daisngid1888017
dc.contributor.daisngid740967
dc.contributor.daisngid2234357
dc.contributor.daisngid2864016
dc.contributor.daisngid1781336
dc.contributor.daisngid9431271
dc.contributor.daisngid21855700
dc.contributor.daisngid12808177
dc.contributor.daisngid28782561
dc.contributor.daisngid5142172
dc.contributor.daisngid31450124
dc.contributor.daisngid2639875
dc.contributor.daisngid12549778
dc.contributor.daisngid19531524
dc.contributor.daisngid8873
dc.contributor.daisngid2200715
dc.contributor.daisngid116294
dc.contributor.wosstandardWOS:Fabelo, H
dc.contributor.wosstandardWOS:Ortega, S
dc.contributor.wosstandardWOS:Lazcano, R
dc.contributor.wosstandardWOS:Madronal, D
dc.contributor.wosstandardWOS:Callico, GM
dc.contributor.wosstandardWOS:Juarez, E
dc.contributor.wosstandardWOS:Salvador, R
dc.contributor.wosstandardWOS:Bulters, D
dc.contributor.wosstandardWOS:Bulstrode, H
dc.contributor.wosstandardWOS:Szolna, A
dc.contributor.wosstandardWOS:Pineiro, JF
dc.contributor.wosstandardWOS:Sosa, C
dc.contributor.wosstandardWOS:O'Shanahan, AJ
dc.contributor.wosstandardWOS:Bisshopp, S
dc.contributor.wosstandardWOS:Hernandez, M
dc.contributor.wosstandardWOS:Morera, J
dc.contributor.wosstandardWOS:Ravi, D
dc.contributor.wosstandardWOS:Kiran, BR
dc.contributor.wosstandardWOS:Vega, A
dc.contributor.wosstandardWOS:Baez-Quevedo, A
dc.contributor.wosstandardWOS:Yang, GZ
dc.contributor.wosstandardWOS:Stanciulescu, B
dc.contributor.wosstandardWOS:Sarmiento, R
dc.date.coverdateFebrero 2018
dc.identifier.ulpgces
dc.description.sjr0,592
dc.description.jcr3,031
dc.description.sjrqQ2
dc.description.jcrqQ2
dc.description.scieSCIE
item.grantfulltextopen-
item.fulltextCon texto completo-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0002-9794-490X-
crisitem.author.orcid0000-0002-7519-954X-
crisitem.author.orcid0000-0002-3784-5504-
crisitem.author.orcid0000-0002-4154-8799-
crisitem.author.orcid0000-0003-2767-6898-
crisitem.author.orcid0000-0002-4843-0507-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameFabelo Gómez, Himar Antonio-
crisitem.author.fullNameOrtega Sarmiento,Samuel-
crisitem.author.fullNameMarrero Callicó, Gustavo Iván-
crisitem.author.fullNameVega Martínez, Aurelio-
crisitem.author.fullNameBáez Quevedo, Abelardo-
crisitem.author.fullNameSarmiento Rodríguez, Roberto-
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