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Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/23787
Campo DC Valoridioma
dc.contributor.authorGomez, Luisen_US
dc.contributor.authorOspina, Raydonalen_US
dc.contributor.authorFrery, Alejandro C.en_US
dc.contributor.otherFrery, Alejandro-
dc.contributor.otherOspina, Raydonal-
dc.date.accessioned2017-09-29T02:31:33Z-
dc.date.accessioned2018-03-15T14:29:47Z-
dc.date.available2017-09-29T02:31:33Z-
dc.date.available2018-03-15T14:29:47Z-
dc.date.issued2017en_US
dc.identifier.issn2072-4292en_US
dc.identifier.urihttp://hdl.handle.net/10553/23787-
dc.description.abstractSAR (Synthetic Aperture Radar) imaging plays a central role in Remote Sensing due to, among other important features, its ability to provide high-resolution, day-and-night and almost weather-independent images. SAR images are affected from a granular contamination, speckle, that can be described by a multiplicative model. Many despeckling techniques have been proposed in the literature, as well as measures of the quality of the results they provide. Assuming the multiplicative model, the observed image Z is the product of two independent fields: the backscatter X and the speckle Y. The result of any speckle filter is Xb, an estimator of the backscatter X, based solely on the observed data Zen
dc.formatapplication/pdfes
dc.languageengen_US
dc.relation.ispartofRemote Sensingen_US
dc.rightsby-nc-ndes
dc.sourceRemote Sensing [ISSN 2072-4292], v. 9 (4), (389)en_US
dc.subject3307 Tecnología electrónicaes
dc.subject.otherQuality assessmenten
dc.subject.otherRatio imagesen
dc.subject.otherSynthetic Aperture Radar (SAR)en
dc.subject.otherSpeckleen
dc.subject.otherSpeckle filtersen
dc.titleUnassisted quantitative evaluation of despeckling filtersen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/rs9040389
dc.identifier.scopus85029426358
dc.identifier.isi000402571700088-
dcterms.isPartOfRemote Sensing
dcterms.sourceRemote Sensing[ISSN 2072-4292],v. 9 (4)
dc.contributor.authorscopusid56789548300
dc.contributor.authorscopusid23009700500
dc.contributor.authorscopusid7003561251
dc.identifier.eissn2072-4292-
dc.identifier.issue4-
dc.relation.volume9-
dc.investigacionIngeniería y Arquitecturaes
dc.rights.accessrightsinfo:eu-repo/semantics/openAccessen_US
dc.type2Artículoen_US
dc.identifier.wosWOS:000402571700088-
dc.contributor.daisngid746480
dc.contributor.daisngid783648-
dc.contributor.daisngid3038242-
dc.contributor.daisngid215914-
dc.identifier.investigatorRIDA-8855-2008-
dc.identifier.investigatorRIDI-8878-2012-
dc.identifier.externalWOS:000402571700088-
dc.contributor.wosstandardWOS:Gomez, L
dc.contributor.wosstandardWOS:Ospina, R
dc.contributor.wosstandardWOS:Frery, AC
dc.date.coverdateAbril 2017
dc.identifier.ulpgcSíes
dc.description.sjr1,386
dc.description.jcr3,406
dc.description.sjrqQ1
dc.description.jcrqQ2
dc.description.scieSCIE
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.orcid0000-0002-8002-5341-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad (IUCES)-
crisitem.author.fullNameGómez Déniz, Luis-
crisitem.author.fullNameC. Frery, Alejandro-
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