Identificador persistente para citar o vincular este elemento: https://accedacris.ulpgc.es/jspui/handle/10553/163085
Campo DC Valoridioma
dc.contributor.authorVitale, Sergioen_US
dc.contributor.authorFerraioli, Giampaoloen_US
dc.contributor.authorPascazio, Vitoen_US
dc.contributor.authorDeniz, Luis Gomezen_US
dc.date.accessioned2026-04-13T06:28:30Z-
dc.date.available2026-04-13T06:28:30Z-
dc.date.issued2025en_US
dc.identifier.issn2153-6996en_US
dc.identifier.otherScopus-
dc.identifier.urihttps://accedacris.ulpgc.es/jspui/handle/10553/163085-
dc.description.abstractIn the recent years many deep learning (DL) based solutions for SAR image despeckling have been proposed. These solutions vary from different aspects: training approaches, architectures and cost functions. Even if different cost functions have been proposed, from simple to multi-objective ones, the training is still mainly based on the use of euclidean norms as loss term. In this work the inclusion of SAR theoretical background in the cost function is exploited. In particular, assessing metrics specifically designed for the evaluation of despeckling filters are considered as cost function for the training of DL solutions. Results on validation dataset and on real data motivate to further investigate in this direction.en_US
dc.languageengen_US
dc.relation.ispartofInternational Geoscience And Remote Sensing Symposium (Igarss)en_US
dc.sourceInternational Geoscience and Remote Sensing Symposium (IGARSS)[ISSN 2153-6996], p. 692-695, (Enero 2025)en_US
dc.subject33 Ciencias tecnológicasen_US
dc.subject.otherAssessmenten_US
dc.subject.otherCnnen_US
dc.subject.otherDeep Learningen_US
dc.subject.otherDespecklingen_US
dc.subject.otherImage Restorationen_US
dc.subject.otherSaren_US
dc.titleIncluding SAR assessing metrics in despeckling networksen_US
dc.typeinfo:eu-repo/semantics/conferenceObjecten_US
dc.typeConferenceObjecten_US
dc.relation.conferenceIEEE International Geoscience and Remote Sensing Symposium IGARSS 2025en_US
dc.identifier.doi10.1109/IGARSS55030.2025.11242506en_US
dc.identifier.scopus105033579441-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.orcidNO DATA-
dc.contributor.authorscopusid57201522451-
dc.contributor.authorscopusid21933757700-
dc.contributor.authorscopusid7003486376-
dc.contributor.authorscopusid56789548300-
dc.identifier.eissn2153-7003-
dc.description.lastpage695en_US
dc.description.firstpage692en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Actas de congresosen_US
dc.utils.revisionen_US
dc.date.coverdateEnero 2025en_US
dc.identifier.conferenceidevents159309-
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
item.fulltextSin texto completo-
item.grantfulltextnone-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad-
crisitem.author.fullNameGómez Déniz, Luis-
Colección:Actas de congresos
Vista resumida

Google ScholarTM

Verifica

Altmetric


Comparte



Exporta metadatos



Los elementos en ULPGC accedaCRIS están protegidos por derechos de autor con todos los derechos reservados, a menos que se indique lo contrario.