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dc.contributor.authorSuárez Rivero, José Pabloen_US
dc.contributor.authorMoreno García, Taniaen_US
dc.contributor.authorQuevedo Gutiérrez, Eduardo Gregorioen_US
dc.contributor.authorPerdomo Peña, Franciscoen_US
dc.contributor.authorPlaza De La Hoz, Ángelen_US
dc.contributor.authorPadrón Medina, Miguel Ángelen_US
dc.contributor.authorAbad Real, María Pilaren_US
dc.date.accessioned2026-03-13T12:19:36Z-
dc.date.available2026-03-13T12:19:36Z-
dc.date.issued2012en_US
dc.identifier.urihttps://accedacris.ulpgc.es/jspui/handle/10553/160551-
dc.description.abstractMesh refinement has been a continued area of research in applied mathematics and engineering applications in last two decades. Especially in 3 Dimensions, it has received much attention for Finite Element Method, where a given volume domain needs to be discretized by using standard elements as tetrahedral or hexahedra prior to be used as an input of the solver module. More concisely, let T(ABCD) be a tetrahedron with vertexes A, B, C and D. The longest-edge trisection of T(ABCD) is as follows: choose the longest edge (say AB) of T(ABCD), let E and F be the points which divide in three AB, then replace T(ABCD) by three tetrahedra T(ACDE), T(CDEF) and T(BCDF). If Longest Edge [3, 4] trisection is iteratively applied to an initial tetrahedron, then it is proved that the diameters of the resulting tetrahedra are between two sharped experimental decreasing functions. The problem of convergence of the triangulations generated by these methods is of importance. We focus on the convergence problem that study how fast the diameters of the resulting tetrahedra tend to zero as repeated Longest Edge trisection is performed. The counterpart problem in 2D have been solved for the Longest Edge Bisection and Trisection, by a series of works by Kearfott, Stynes, Adler, Plaza and Suárez et al. We present empirical evidence of the convergence study in 3D and some other ongoing results will be given for the LE n-section of tetrahedra when n≥4. Our contribution helps to a better understanding of partitioning and refinement methods in 3 Dimensions.en_US
dc.languageengen_US
dc.subject12 Matemáticasen_US
dc.titleResults on the Convergence of the Longest-Edge Trisection Method for Tetrahedral Meshesen_US
dc.typeinfo:eu-repo/semantics/conferenceobjecten_US
dc.typeConferenceObjecten_US
dc.relation.conference12th MASCOT-ISGG (Meeting on Applied Scientific Computing and Tools - International Society for Grid Generation), Las Palmas de Gran Canariaen_US
dc.investigacionCienciasen_US
dc.type2Actas de congresosen_US
dc.description.notasSegún Memoria de investigación ULPGC 2012 es un posteren_US
dc.utils.revisionen_US
dc.date.coverdate23/10/2012en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INFen_US
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Matemáticas-
crisitem.author.deptGIR IUMA: Matemáticas, Gráficos y Computación-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Civil-
crisitem.author.deptDepartamento de Cartografía y Expresión Gráfica en La Ingeniería-
crisitem.author.orcid0000-0001-8140-9008-
crisitem.author.orcid0000-0002-5415-3446-
crisitem.author.orcid0000-0002-5077-6531-
crisitem.author.orcid0000-0001-5493-3090-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameSuárez Rivero, José Pablo-
crisitem.author.fullNameMoreno García, Tania-
crisitem.author.fullNameQuevedo Gutiérrez, Eduardo Gregorio-
crisitem.author.fullNamePerdomo Peña, Francisco-
crisitem.author.fullNamePlaza De La Hoz, Ángel-
crisitem.author.fullNamePadrón Medina, Miguel Ángel-
crisitem.author.fullNameAbad Real, María Pilar-
Colección:Actas de congresos
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