Identificador persistente para citar o vincular este elemento: https://accedacris.ulpgc.es/jspui/handle/10553/154912
Campo DC Valoridioma
dc.contributor.authorVásquez-Salazar, Rubén Daríoen_US
dc.contributor.authorPuche, William S.en_US
dc.contributor.authorFrery, Alejandro C.en_US
dc.contributor.authorGómez, Luisen_US
dc.date.accessioned2026-01-13T08:07:53Z-
dc.date.available2026-01-13T08:07:53Z-
dc.date.issued2025en_US
dc.identifier.otherScopus-
dc.identifier.urihttps://accedacris.ulpgc.es/jspui/handle/10553/154912-
dc.description.abstractHighlights: What are the main findings? We propose a normalized metric (TDM) that effectively integrates contrast ((Formula presented.)), variance ((Formula presented.)), and Jensen–Shannon Divergence ((Formula presented.)) into a unified quantitative indicator. We combine the analysis of this proposed metric with quality assessment through a novel approach using Image Horizontal Visibility Graphs (IHVG) based on ratio images. What are the implication of the main findings? The proposed approach discriminates between filters that only suppress variance and those that effectively restore the statistical randomness of the ratio images. The proposed quality assessment framework enables the integrated evaluation of image quality by combining statistical descriptors with graph-based texture analysis, providing a more comprehensive characterization of despeckling performance. We present a quantitative and qualitative evaluation of despeckling filters based on a set of Haralick-derived features and the Jensen–Shannon Divergence obtained from ratio images. To that aim, we propose a normalized composite index, called the Texture-Divergence Measurement ((Formula presented.)), that describes the statistical and structural behavior of the filtered images. Complementary qualitative analysis using Image Horizontal Visibility Graphs (IHVGs) confirms the results of the proposed metric. The combination of the proposed (Formula presented.) metric and IHVG visualization provides a robust framework for assessing despeckling performance from both statistical and structural perspectives.en_US
dc.languageengen_US
dc.relation.ispartofRemote Sensingen_US
dc.sourceRemote Sensing[EISSN 2072-4292],v. 17 (24), (Diciembre 2025)en_US
dc.subject33 Ciencias tecnológicasen_US
dc.subject.otherHaralick Featuresen_US
dc.subject.otherRatio Imagesen_US
dc.subject.otherRemote Sensingen_US
dc.subject.otherSpeckleen_US
dc.subject.otherSynthetic Aperture Radaren_US
dc.titleQuality Assessment of Despeckling Filters Based on the Analysis of Ratio Imagesen_US
dc.typeinfo:eu-repo/semantics/Articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/rs17244048en_US
dc.identifier.scopus105025977991-
dc.identifier.isi001647453900001-
dc.contributor.orcid0000-0002-1690-8393-
dc.contributor.orcid0000-0001-5894-7852-
dc.contributor.orcid0000-0002-8002-5341-
dc.contributor.orcid0000-0003-0667-2302-
dc.contributor.authorscopusid58544220200-
dc.contributor.authorscopusid49662040700-
dc.contributor.authorscopusid7003561251-
dc.contributor.authorscopusid56789548300-
dc.identifier.eissn2072-4292-
dc.identifier.issue24-
dc.relation.volume17en_US
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.contributor.daisngidNo ID-
dc.contributor.daisngidNo ID-
dc.contributor.daisngidNo ID-
dc.contributor.daisngidNo ID-
dc.description.numberofpages23en_US
dc.utils.revisionen_US
dc.contributor.wosstandardWOS:Vásquez-Salazar, RD-
dc.contributor.wosstandardWOS:Puche, WS-
dc.contributor.wosstandardWOS:Frery, AC-
dc.contributor.wosstandardWOS:Gomez, L-
dc.date.coverdateDiciembre 2025en_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr1,091
dc.description.jcr4,2
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
dc.description.miaricds10,6
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUCES: Centro de Tecnologías de la Imagen-
crisitem.author.deptIU de Cibernética, Empresa y Sociedad-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-0667-2302-
crisitem.author.parentorgIU de Cibernética, Empresa y Sociedad-
crisitem.author.fullNameGómez Déniz, Luis-
Colección:Artículos
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