Identificador persistente para citar o vincular este elemento: http://hdl.handle.net/10553/136192
Campo DC Valoridioma
dc.contributor.authorHernández Suárez, Emma Cristinaen_US
dc.contributor.authorRodriguez Molina, Adrianen_US
dc.contributor.authorPérez García, Ámbaren_US
dc.contributor.authorMirza-Rosca, Juliaen_US
dc.contributor.authorLópez Feliciano, Joséen_US
dc.date.accessioned2025-02-14T07:36:18Z-
dc.date.available2025-02-14T07:36:18Z-
dc.date.issued2025en_US
dc.identifier.issn0018-9456en_US
dc.identifier.urihttp://hdl.handle.net/10553/136192-
dc.description.abstractMetals in coastal regions are threatened by corrosion, underscoring the need for precise detection and monitoring methods. Traditional methods often face limitations in terms of accuracy and applicability under diverse conditions. This study introduces the corrosion severity index (CSI), an innovative spectral index for assessing corrosion in steel and iron structures. Several iron samples were placed in a salt spray chamber to generate different degrees of corrosion. The samples were analyzed using hyperspectral cameras covering the visible near-infrared (VNIR) to the shortwave infrared (SWIR) spectrum. A scale-invariant feature transform (SIFT) registration algorithm was employed to generate the full spectral signatures from 400 to 1700 nm for each pixel. The CSI combines four spectral bands (457.50, 791.91, 1305.08, and 1442.60 nm) where a pixel value close to 0 represents the absence of corrosion, whereas a higher value indicates greater severity of corrosion. Based on the average CSI values, samples are classified into Grade A, B, C, or D, which indicates the degree of corrosion. CSI demonstrates its ability to detect early-stage corrosion and has been evaluated for robustness across a variety of steel and iron samples in different environmental conditions. In addition, the performance of the CSI is validated by comparing it with the previously published corrosion index (CI). CSI demonstrates a higher accurate ability to detect corrosion products and identify the degree of corrosion with a simplified approach. This index allows a balance between accuracy, low computational demands, and usability, providing an optimal solution for early diagnosis and proactive management of corrosion in coastal infrastructures.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Instrumentation and Measurementen_US
dc.subject.otherCorrosionen_US
dc.subject.otherEarly-stage corrosionen_US
dc.subject.otherHyperspectral imaging (HSI)en_US
dc.subject.otherMultispectral cameraen_US
dc.subject.otherSpectral indicesen_US
dc.titleCorrosion Severity Index (CSI) for Spectral Characterization of Corroded Steel and Iron Samplesen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIM.2025.3527548en_US
dc.identifier.scopus2-s2.0-85214795482-
dc.contributor.orcid0000-0002-2472-0761-
dc.contributor.orcid0000-0001-7590-7895-
dc.contributor.orcid0000-0002-2943-6348-
dc.contributor.orcid0000-0003-0623-3318-
dc.contributor.orcid0000-0002-6304-2801-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.utils.revisionen_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-TELen_US
dc.description.sjr1,536
dc.description.jcr5,6
dc.description.sjrqQ1
dc.description.jcrqQ1
dc.description.scieSCIE
dc.description.miaricds11,0
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptGIR Nanomaterials and Corrosion-
crisitem.author.deptDepartamento de Ingeniería Mecánica-
crisitem.author.deptGIR IUMA: Diseño de Sistemas Electrónicos Integrados para el procesamiento de datos-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0001-7590-7895-
crisitem.author.orcid0000-0002-2943-6348-
crisitem.author.orcid0000-0003-0623-3318-
crisitem.author.orcid0000-0002-6304-2801-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgDepartamento de Ingeniería Mecánica-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameHernández Suárez, Emma Cristina-
crisitem.author.fullNameRodriguez Molina, Adrian-
crisitem.author.fullNamePérez García, Ámbar-
crisitem.author.fullNameMirza Rosca, Julia Claudia-
crisitem.author.fullNameLópez Feliciano, José Francisco-
Colección:Artículos
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