Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/114053
DC FieldValueLanguage
dc.contributor.authorDel Pino Suarez, J.en_US
dc.contributor.authorKhemchandani, Sunil Lalchanden_US
dc.date.accessioned2022-03-14T11:46:12Z-
dc.date.available2022-03-14T11:46:12Z-
dc.date.issued2021en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://hdl.handle.net/10553/114053-
dc.description.abstractInductor-capacitor voltage controlled oscillators (LC-VCOs) are the most common type of oscillator used in sensors systems, such as transceivers for wireless sensor networks (WSNs), VCO-based reading circuits, VCO-based radar sensors, etc. This work presents a technique to reduce the LC-VCOs phase noise using a new current-shaping method based on a feedback injection mechanism with only two additional transistors. This technique consists of keeping the negative resistance seen from LC tank constant throughout the oscillation cycle, achieving a significant phase noise reduction with a very low area increase. To test this method an LC-VCO was designed, fabricated and measured on a wafer using 90 nm CMOS technology with 1.2 V supply voltage. The oscillator outputs were buffered using source followers to provide additional isolation from load variations and to boost the output power. The tank was tuned to 1.8 GHz, comprising two 1.15 nH with 1.5 turns inductors with a quality factor (Q) of 14, a 3.27 pF metal-oxide-metal capacitor, and two varactors. The measured phase noise was −112 dBc/Hz at 1 MHz offset. Including the pads, the chip area is 750 × 850 µm2 .en_US
dc.languageengen_US
dc.relation.ispartofSensors (Switzerland)en_US
dc.sourceSensors (Switzerland) [ISSN 1424-8220], v. 21 (19), 6583, (Octubre 2021)en_US
dc.subject3325 Tecnología de las telecomunicacionesen_US
dc.subject.otherLC-VCOen_US
dc.subject.otherCMOSen_US
dc.subject.otherPhase noiseen_US
dc.subject.otherCurrent-shapingen_US
dc.subject.other90 nmen_US
dc.subject.otherCurrent tailen_US
dc.subject.otherVaractoren_US
dc.subject.otherLC tanken_US
dc.subject.otherOn-waferen_US
dc.titleA New Current-Shaping Technique Based on a Feedback Injection Mechanism to Reduce VCO Phase Noiseen_US
dc.typeinfo:eu-repo/semantics/articleen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s21196583en_US
dc.identifier.pmid34640903-
dc.identifier.scopus2-s2.0-85116113805-
dc.identifier.isiWOS:000757299300026-
dc.contributor.orcid#NODATA#-
dc.contributor.orcid#NODATA#-
dc.identifier.issue19-
dc.investigacionIngeniería y Arquitecturaen_US
dc.type2Artículoen_US
dc.description.notasThis article belongs to the Special Issue Advanced CMOS Integrated Circuit Design and Applicationen_US
dc.utils.revisionen_US
dc.identifier.ulpgcen_US
dc.contributor.buulpgcBU-INGen_US
dc.description.sjr0,636
dc.description.jcr3,576
dc.description.sjrqQ2
dc.description.jcrqQ1
dc.description.scieSCIE
dc.description.miaricds10,8
item.fulltextCon texto completo-
item.grantfulltextopen-
crisitem.author.deptGIR IUMA Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.deptGIR IUMA Sistemas de Información y Comunicaciones-
crisitem.author.deptIU de Microelectrónica Aplicada-
crisitem.author.deptDepartamento de Ingeniería Electrónica y Automática-
crisitem.author.orcid0000-0003-2610-883X-
crisitem.author.orcid0000-0003-0087-2370-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.parentorgIU de Microelectrónica Aplicada-
crisitem.author.fullNameDel Pino Suárez, Francisco Javier-
crisitem.author.fullNameLalchand Khemchandani, Sunil-
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