Publicaciones

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12 artículo
2 comentario

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Title Issue Date
Normalization and shape recognition of three-dimensional objects by 3D moments Galvez, J. M.; Canton, M. Issued date: 1993 Source: Pattern Recognition [ISSN 0031-3203], v. 26 (5), p. 667-681 SCIE Artículo
Normalization And Shape-Recognition Of 3-Dimensional Objects By 3D Moments Galvez Lamolda, José M.; Cantón-Garbín, Manuel Issued date: 1993 DOI: 10.1016/0031-3203(93)90120-L Source: Pattern Recognition [ISSN 0031-3203],v. 26 (5), p. 667-681, (Mayo 1993) SCIE Artículo
Wavelet modeling of contour deformations in Sobolev spaces for litting and tracking applications Pérez Nava, Fernando; Falcón Martel, Antonio Issued date: 2003 DOI: 10.1016/S0031-3203(02)00168-1 Source: Pattern Recognition [ISSN 0031-3203], v. 36 (5), p. 1119-1130, (Mayo 2003) JCR: 1,611 - Q1 SCIE Artículo
Off-line signature verification based on grey level information using texture features Vargas, J. F.; Ferrer, M. A. ; Travieso, C. M. ; Alonso, J. B. Issued date: 2011 DOI: 10.1016/j.patcog.2010.07.028 Source: Pattern Recognition[ISSN 0031-3203],v. 44, p. 375-385 SJR: 1,346 - Q1 JCR: 2,292 - Q1 SCIE Artículo
Distance maps from unthresholded magnitudes Antón-Canalís, Luis; Hernández Tejera, Mario ; Sánchez-Nielsen, Elena Issued date: 2012 DOI: 10.1016/j.patcog.2012.02.010 Source: Pattern Recognition [ISSN 0031-3203], v. 45 (9), p. 3125-3130 SJR: 1,376 - Q1 JCR: 2,632 - Q1 SCIE Artículo
Selected papers from iberian conference on pattern recognition and image analysis Hernández Tejera, Mario ; Sanches, João M.; Vitrià, Jordi Issued date: 2012 DOI: 10.1016/j.patcog.2012.04.005 Source: Pattern Recognition [ISSN 0031-3203], v. 45 (9), p. 3047 SJR: 1,376 - Q1 JCR: 2,632 - Q1 SCIE Comentario
Camera calibration in sport event scenarios Alemán-Flores, M. ; Álvarez, L ; Gomez, L. ; Henriquez, P.; Mazorra, L. Issued date: 2014 DOI: 10.1016/j.patcog.2013.05.011 Source: Pattern Recognition [ISSN 0031-3203], v. 47 (1), p. 89-95 SJR: 1,436 - Q1 JCR: 3,096 - Q1 SCIE Artículo
Special issue on computer vision applying pattern recognition techniques Gomez, Luis ; Alvarez, Luis ; Jacobo-Berlles, Julio; Mejail, Marta Issued date: 2014 DOI: 10.1016/j.patcog.2013.08.015 Source: Pattern Recognition[ISSN 0031-3203],v. 47, p. 9-11 SJR: 1,436 - Q1 JCR: 3,096 - Q1 SCIE Comentario
Speckle reduction in polarimetric SAR imagery with stochastic distances and nonlocal means Torres, Leonardo; Sant'Anna, Sidnei J.S.; Da Costa Freitas, Corina; Frery, Alejandro C. Issued date: 2014 DOI: 10.1016/j.patcog.2013.04.001 Source: Pattern Recognition[ISSN 0031-3203],v. 47, p. 141-157 SJR: 1,436 - Q1 JCR: 3,096 - Q1 SCIE Artículo
On-line signature recognition through the combination of real dynamic data and synthetically generated static data Galbally, Javier; Diaz-Cabrera, Moises ; Ferrer, Miguel A. ; Gomez-Barrero, Marta; Morales, Aythami, et al Issued date: 2015 DOI: 10.1016/j.patcog.2015.03.019 Source: Pattern Recognition[ISSN 0031-3203],v. 48, p. 2921-2934 SJR: 1,671 - Q1 JCR: 3,399 - Q1 SCIE Artículo
Temporal evolution in synthetic handwriting Carmona-Duarte, Cristina ; Ferrer, Miguel A. ; Parziale, Antonio; Marcelli, Angelo Issued date: 2017 DOI: 10.1016/j.patcog.2017.03.019 Source: Pattern Recognition[ISSN 0031-3203],v. 68, p. 233-244 SJR: 1,065 - Q1 JCR: 3,965 - Q1 SCIE Artículo
SVC-onGoing: Signature verification competition Tolosana, Ruben; Vera-Rodriguez, Ruben; Gonzalez-Garcia, Carlos; Fierrez, Julian; Morales, Aythami, et al Issued date: 2022 DOI: 10.1016/j.patcog.2022.108609 Source: Pattern Recognition [ISSN 0031-3203], v. 127, 108609, (Julio 2022) SJR: 2,085 - Q1 JCR: 8,0 - Q1 SCIE MIAR ICDS: 11,0 Artículo
Online signature verification based on the lagrange formulation with 2D and 3D robotic models Diaz, Moises ; Ferrer, Miguel A. ; Gil, Juan M. ; Rodriguez, Rafael ; Zhang, Peirong, et al Issued date: 2025 DOI: 10.1016/j.patcog.2025.111581 Source: Pattern Recognition [ISSN 0031-3203], v. 164, (Agosto 2025) SJR: 2,732 - Q1 JCR: 7,5 - Q1 SCIE MIAR ICDS: 11,0 Artículo
A survey of handwriting synthesis from 2019 to 2024: A comprehensive review Díaz Cabrera, Moisés ; Mendoza García, Andrea; Ferrer Ballester, Miguel Ángel ; Sabourin, Robert Issued date: 2025 DOI: 10.1016/j.patcog.2025.111357 Source: Pattern Recognition [ISSN 0031-3203], v. 162, (Junio 2025) SJR: 2,732 - Q1 JCR: 7,5 - Q1 SCIE MIAR ICDS: 11,0 Artículo