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Name IEEE Transactions on Electron Devices

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Structure: departamento de ingeniería electrónica y automática

Structure: gir iuma: tecnología microelectrónica

Researcher: rodríguez del rosario, raúl

Title Issue Date
Thermal resistance characterization for multifinger SOI-MOSFETs Gonzalez, Benito ; Rodriguez, Raul ; Lázaro, Antonio Issued date: 2018 DOI: 10.1109/TED.2018.2853799 Source: IEEE Transactions on Electron Devices[ISSN 0018-9383],v. 65 (8419075), p. 3626-3632 SJR: 0,853 - Q1 JCR: 2,704 - Q2 SCIE Artículo
Gate Geometry-Dependent Thermal Impedance of Depletion Mode HEMTs Gonzalez, Benito ; Lazaro, Antonio; Rodriguez, Raul Issued date: 2023 DOI: 10.1109/TED.2023.3305313 Source: IEEE Transactions on Electron Devices[ISSN 0018-9383], (Enero 2023) SJR: 0,773 - Q2 JCR: 3,1 - Q2 SCIE MIAR ICDS: 11,0 Artículo