Statistics: 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

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Geo Map
Region #
NA - North America 195
AS - Asia, other 5
EU - Europe 1
Total 201
Country #
US - United States of America 195
SG - Singapore 5
DE - Germany 1
Total 201
City #
Singapore 2
Chandler 1
Nuremberg 1
Unknown 197
Total 201


Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Tot
2021 00 0000 0100 00 1
2022 00 0000 0001 00 1
2023 00 3000 00101 00 14
2024 1530 0022 01285 30 185
Ever 201