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Name Pattern Recognition

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Structure: gir siani: inteligencia artificial, redes neuronales, aprendizaje automático e ingeniería de datos

Title Issue Date
Wavelet modeling of contour deformations in Sobolev spaces for litting and tracking applications Pérez Nava, Fernando; Falcón Martel, Antonio Issued date: 2003 DOI: 10.1016/S0031-3203(02)00168-1 Source: Pattern Recognition [ISSN 0031-3203], v. 36 (5), p. 1119-1130, (Mayo 2003) JCR: 1,611 - Q1 SCIE Artículo
Selected papers from iberian conference on pattern recognition and image analysis Hernández Tejera, Mario ; Sanches, João M.; Vitrià, Jordi Issued date: 2012 DOI: 10.1016/j.patcog.2012.04.005 Source: Pattern Recognition [ISSN 0031-3203], v. 45 (9), p. 3047 SJR: 1,376 - Q1 JCR: 2,632 - Q1 SCIE Comentario
Distance maps from unthresholded magnitudes Antón-Canalís, Luis; Hernández Tejera, Mario ; Sánchez-Nielsen, Elena Issued date: 2012 DOI: 10.1016/j.patcog.2012.02.010 Source: Pattern Recognition [ISSN 0031-3203], v. 45 (9), p. 3125-3130 SJR: 1,376 - Q1 JCR: 2,632 - Q1 SCIE Artículo