Name IEEE International Geoscience and Remote Sensing Symposium proceedings

View Statistics Email Alert RSS Feed

Refined By:

Structure: gir iuces: centro de tecnologías de la imagen

Structure: iu de cibernética, empresa y sociedad (iuces)

Researcher: gómez déniz, luis

Structure: departamento de informática y sistemas

Title Issue Date
Local edginess measures in PolSAR imagery by using stochastic distances Gómez Déniz, Luis ; Alvarez, Luis ; Frery, Alejandro C. Issued date: 2018 DOI: 10.1109/IGARSS.2018.8518008 Source: IEEE International Geoscience and Remote Sensing Symposium proceedings [ISSN 2153-6996], p. 5796-5799, (2018) Actas de congresos