Name IEEE International Geoscience and Remote Sensing Symposium proceedings

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Structure: iu de cibernética, empresa y sociedad (iuces)

Type: actas de congresos

Researcher: álvarez león, luis miguel

Title Issue Date
Local edginess measures in PolSAR imagery by using stochastic distances Gómez Déniz, Luis ; Alvarez, Luis ; Frery, Alejandro C. Issued date: 2018 DOI: 10.1109/IGARSS.2018.8518008 Source: IEEE International Geoscience and Remote Sensing Symposium proceedings [ISSN 2153-6996], p. 5796-5799, (2018) Actas de congresos