Name IEEE Transactions on Reliability

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An intrinsic order criterion to evaluate, large, complex fault trees González, L. ; García, D. ; Galván, B. Issued date: 2004 DOI: 10.1109/TR.2004.833307 Source: IEEE Transactions On Reliability [ISSN 0018-9529], v. 53 (3), p. 297-305, (Septiembre 2004) JCR: 0,828 - Q2 SCIE Artículo
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches Sánchez Clemente, Antonio José ; Entrena, Luis; Hrbacek, Radek; Sekanina, Lukas Issued date: 2016 DOI: 10.1109/TR.2016.2604918 Source: IEEE Transactions on Reliability [ISSN 0018-9529], v. 65(4), p. 1871-1883, (Diciembre 2016) SJR: 1,335 - Q1 JCR: 2,79 - Q1 SCIE Artículo