Please use this identifier to cite or link to this item: http://hdl.handle.net/10553/49951
Title: Process and Film Characterization of Chemical-Bath-Deposited ZnS Thin Films
Authors: Doña, J. M. 
Herrero, J.
UNESCO Clasification: 221005 Electroquímica
Issue Date: 1994
Publisher: 0013-4651
Journal: Journal of the Electrochemical Society 
Abstract: Chemical‐bath deposition of thin films from NH3/NH2-NH2/SC(NH2)2/ZnSO4 solutions has been studied. The effect of various process parameters on the growth and the film quality is presented. A first approach to a mechanistic interpretation of the chemical process is reported. The structural, optical, chemical, and electrical properties of the thin films deposited by this method have been studied. The electron diffraction (EDS) analysis shows that the films are microcrystalline with a cubic structure. EDS analysis has demonstrated that the films are highly stoichiometric. Scanning electron microscopy studies of the thin films deposited by this method show that the films are continuous and homogeneous. Electrical conductivity measurements have shown the highly resistivity nature of these films.
URI: http://hdl.handle.net/10553/49951
ISSN: 0013-4651
DOI: 10.1149/1.2054685
Source: Journal of the Electrochemical Society [ISSN 0013-4651], v. 141, p. 205-210
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