Title Issue Date
Automatic lab system for optical, electrical, and thermal inspection of PCBs Vega García, Carlos ; Vega Martínez, Aurelio ; Merino Fernández, Irene ; Pérez Báez, Oscar Issued date: 2022 DOI: 10.1109/TAEE54169.2022.9840735 Source: 2022 Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (XV Technologies Applied to Electronics Teaching Conference) Actas de congresos
Phased Array Antenna Analysis Workflow Applied to Gateways for LEO Satellite Communications Merino Fernández, Irene ; Khemchandani, S. L. ; Del Pino Suárez, Francisco Javier ; Saiz Pérez, José Luis Issued date: 2022 DOI: 10.3390/s22239406 Source: Sensors (Switzerland) [ISSN 1424-8220], v. 22 (23), 9406, (2022) SJR: 0,803 - Q1 JCR: 3,847 - Q1 SCIE MIAR ICDS: 10,8 Artículo