Title Issue Date
Parametric and nonparametric tests for speckled imagery Cintra, Renato J.; Frery, Alejandro C. ; Nascimento, Abraão D C Issued date: 2013 DOI: 10.1007/s10044-011-0249-3 Source: Pattern Analysis and Applications[ISSN 1433-7541],v. 16, p. 141-161 SJR: 0,47 - Q3 JCR: 0,742 - Q3 SCIE Artículo
Guest editorial: special issue on pedestrian attribute recognition and person re-identification Greco, Antonio; Castrillon-Santana, Modesto ; Vento, Bruno Issued date: 2025 DOI: 10.1007/s10044-025-01525-7 Source: Pattern Analysis And Applications [ISSN 1433-7541], v. 28 (139), (Julio 2025) SJR: 0,783 - Q2 JCR: 3,7 - Q2 SCIE MIAR ICDS: 10,9 Artículo