Dealcala, Daniel; Morales, Aythami; Tolosana, Ruben; Acien, Alejandro; Fierrez, Julian, et al
Issued date: 2023
Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops[ISSN 2160-7508],v. 2023-June, p. 1051-1060, (Enero 2023)
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